The most cost-effective memory test solution in the Internet of Things era

With the advent of the Internet of Things era, we should not pay attention to mobile phones or any mobile devices, but should pay attention to new needs. The opportunity for Taiwan to let go of the industry is to grasp the Internet of Things, rather than focusing on hardware development. This does not mean giving up hardware, but learning to master the intelligent services that hardware can develop. If Taiwan continues to do hardware, there may still be a future, but who will be the winner? So you can't just look at the hardware, it depends on which applications on these platforms have not yet been tapped.

So how do you create the value of the "Internet of Things"? The first is to make the price of hardware for developing IoT low enough for many Maker to be accepted, so that the creator who is interested in developing the intelligent service of the Internet of Things can easily get the relevant hardware. . Therefore, how to reduce the price of IoT-related chips has become a topic worth exploring in the IoT business model. The hardware architecture of the IoT chip requires embedded flash (EFlash) to store the program. Therefore, the test cost of EFlash will also determine the development cost of the IoT chip. In this meager profit era and the IoT development platform, the cost will be the key. It will determine whether the IoT development platform will be widely used. Customer adoption!

Houyi Technology is the only supplier in the world to focus on the development of memory testing solutions for Silicon Property (Intel) and integrated memory test development tools. BIST (Built-In Self-Test) is a standard for embedded memory testing. Over the past few years, the BIST requirements for memory have grown with the demands of various emerging markets, including the Internet of Things and automotive electronics. Today's memory test solutions need to support a variety of memory detection schemes including embedded flash (Embedded). Flash; EFlash) StaTIc Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), etc.

Houyi Technology has many patents in memory test solutions. Based on its unique memory test patent, Houyi Technology has developed an embedded flash test solution (EFlash BIST). EFlash BIST has revolutionized the traditional BIST architecture, and EFlash BIST leverages the hardware architecture design to achieve optimized area and test time. EFlash BIST is a customized IP, thick wing technology R & D team, developed a dedicated EFlash BIST IP for the customer's EFlash and the required test items. This customized EFlash BIST IP will significantly reduce EFlash test time.

The traditional EFlash test solution can be used directly by AutomaTIon Test Equipment (ATE) or BIST from EFlash's supplier. Using ATE for EFlash testing, due to the long test time, the test cost is too high, quite inconsistent with the cost requirements of the Internet of Things development platform. However, with the BIST solution provided by the EFlash provider, it is very difficult for the user to integrate the BIST circuit with the EFlash in a short time (Fig. 1), resulting in the development of the entire IoT chip for too long.

Figure 1: The implementation process of the traditional EFlash BIST

Based on the inconvenience of the above two points, Thickwing Technology simplifies the implementation process of the traditional EFlash BIST as follows (Figure 2).

Figure 2: Ewing BIST implementation process of Thickwing Technology

Ewing BIST IP of Houyi Technology can provide various test programs such as CP1, CP2, CP4, FT and other test items according to the needs of customers on the test items. In addition, Thickwing's EFlash BIST IP requires very few test pins (Pin), and Thickwing's EFlash BIST IP provides the following Programmable features including Change ATE SetTIng, Algorithm, Program TIme, Erase Time, Address Sequence, Data Background, etc. Thickwing's EFlash BIST IP can also provide diagnostic solutions, including Algorithm, Command, Address, Data, etc., allowing IoT chip developers to use as the basis for chip error analysis.

With the advent of the Internet of Things, many emerging applications have emerged. How to make "Creator" easy to get started with an IoT development platform is the common goal of many IoT hardware developers. In addition to the sufficient functionality, "price" is another decision whether the IoT development platform will be The decisive factor for widespread use. Ewing BIST IP from Thickwing Technology can significantly reduce EFlash test time, protect customer test patterns (Test Pattern) and shorten EFlash BIST development time. Therefore, Ewing BIST IP of Thickwing Technology is definitely the best cost-effective memory testing solution in the Internet of Things era.

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